[ Identification | Description | Input parameters | Links ]

The `Reflectometer` Instrument

Simple reflectometer with two slits, a sample (either none, mirror or multilayer), and a detector. For use in the OMIC summer school 2012.

Identification

Site: e
Author: Pia Jensen (bozack@bozack.dk)
Origin: Niels Bohr Instute, University of Copenhagen
Date: 13.08.2012

Description

This simple reflectometer consists of a source (using the standard PSI parameters
for three Maxwellian distributions), on which the user can control the bandwidth
by simply choosing a minumum and maximum value. Two slits handle the divergence
distribution on the sample. The sample itself can either be an empty spot, a simple
mirror, or a multilayer. A simple PSD detector is used for detecting the scattered
beam. The scattering is in the horizontal plane.

Example: mcrun reflectometer.instr

Input parameters

Parameters in boldface are required; the others are optional.

Name	Unit	Description	Default
lambda_min	AA	Minimum wavelength from source	5.3
lambda_max	AA	Maximum wavelength from source	5.45
slittranslation	m	Translation of slit (horizontal)	0
sampletranslation	m	Sample translation (horizontal)	0
slitwidth	m	Width of slit pinholes	0.001
slitheight	m	Height of slit pinholes	0.002
dist_source2slit	m	Distance between source and first slit	1
dist_slit2slit	m	Distance between slits	3.2
dist_slit2sample	m	Distance between second slit and sample	0.18
dist_sample2detector	m	Distance between sample and detector	2
sampletype	1	Sample type: 0 none, 1 mirror, 2+ multilayer	1
samplesize	m	Side-length of the (quadratic) sample plate	0.15
substratethickness	m	Thickness of the substrate	0.003
MR_Qc	AA	Critical Q-vector length of mirror sample	0.15
sampleangle	deg	Rotation angle of sample (theta)	2.5
detectorangle	deg	Rotation angle of detector (2 theta)	5

The Reflectometer Instrument

Identification

Description

Input parameters

Links

The `Reflectometer` Instrument